Library Automation and Digital Archive
LONTAR
Fakultas Ilmu Komputer
Universitas Indonesia

Pencarian Sederhana

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Call Number SEM-290
Collection Type Indeks Artikel prosiding/Sem
Title VLSI testing: advanced memory testing algorithms and switch level memory model for srams, HAL. 264-268
Author Indira Rawat;
Publisher Proceeding (ICETAETS 2008) of the first International Conf. on Emerging Tenologies and Applications in Engineering, Technology and Scieces, 13-14, January 2008(ICETAETS 2008)
Subject Fault signature, fault dictionary march algorithms
Location
Lokasi : Perpustakaan Fakultas Ilmu Komputer
Nomor Panggil ID Koleksi Status
SEM-290 TERSEDIA
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