| DaftarIsitemplate |
| Call Number |
| SEM-290 |
| Title |
| VLSI testing: advanced memory testing algorithms and switch level memory model for srams, HAL. 264-268 |
| Author |
| Indira Rawat; |
| Publisher |
| Proceeding (ICETAETS 2008) of the first International Conf. on Emerging Tenologies and Applications in Engineering, Technology and Scieces, 13-14, January 2008(ICETAETS 2008) |
| Subject |
| Fault signature, fault dictionary march algorithms |
| Location |