| DaftarIsitemplate |
| Call Number |
| SEM-234 |
| Title |
| Testing self-timed circuits using partial scan, Hal. 160-169 |
| Author |
| Ajay Khoche; Erik Brunvand; |
| Publisher |
| Proceedings : asynchronous design methodologies, May 30-31, 1995 London, England, 1995 |
| Subject |
| Location |