| Your search for 2164 returns 305 document(s) |
| Cracking the GRE 2009 edition/ Karen Lurie, Magda Pecsenye and Adam Robinson |
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Call Number: 378.166 2 Cra | Type: Buku
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| TOEFL sample test |
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Call Number: 425 Toe | Type: Buku
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| a technology for test-item writing |
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Author: Roid, Galeh H.; | Call Number: 371.2 Roi t | Type: Buku Pusat
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| ATE: Automatic test equipment |
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Author: Stover, Allan C.; | Call Number: 621.395 Sto a | Type: Buku Pusat
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| IEEE Design & Test of Computers |
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Call Number: [1 (1984): 1-4, 2 (1985): 1-4,6, 2 (1985): 1-4,6, 3 (1986): 1-6, 3 (1986): 1-6, 4 (1987): 6-7, 5 (1988): 1-2, 6 (1989): 1-6, 7 (1990): 1-2, 13 (1996): 1-3] | Type: Jurnal/ Majalah
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| Test-driven development by example |
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Author: Beck, Kent; | Call Number: 005.1 Bec t | Type: Buku
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| Proyek test tool kriptografi |
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Author: Syaddam Hidayat; | Call Number: KP-1567 (Softcopy KP-1128) | Type: Kerja Praktek (KP)
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| Wavelet Synopses for General Error Metrics, page 888-928 |
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Author: M. Garofalakis, [et all] | Type: Indeks Artikel Jurnal
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| Structuring fortran 77 for business and general applications |
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Author: Seeds, Harice L.; | Call Number: 005.133 See s | Type: Buku Pusat
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| Segmentasi based retrieval on general images, HAL. 69-73 |
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Author: Suhendro Y. Irianto; Sri Lestari; | Call Number: SEM-294 | Type: Indeks Artikel prosiding/Sem
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