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Analog VLSI and neural systems
Author: Mead, Carver A.; | Call Number: 621.395 Mea a | Type: Buku Pusat
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Design of VLSI gate array ICs
Author: Hollis, Ernest E.; | Call Number: 621.395 Hol d | Type: Buku Pusat
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Tutorial: VLSI testing & validation techniques/ Hassan K. Reghbati
Call Number: 621.395 07 Reg | Type: Buku
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Operational amplifiers and linear integrated circuits 3rd ed./ Robert F. Coughlin
Author: Coughlin, Robert F.; | Call Number: 621.381 Cou o | Type: Buku
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Introduction to software testing/ Paul Ammann
Author: Ammann, Paul; | Call Number: 004.21 Amm i | Type: Buku
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VLSI testing: advanced memory testing algorithms and switch level memory model for srams, HAL. 264-268
Author: Indira Rawat; | Call Number: SEM-290 | Type: Indeks Artikel prosiding/Sem
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An introduction to the analysis of algorithms/Robert Sedgewick; Philippe Flajolet
Author: Sedgewick, Robert; | Call Number: 005.1 Sed i | Type: Buku
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Testing object-oriented systems: models patterns and tools/Robert V. Binder
Author: Binder, Robert V.; | Call Number: 005.117 Bin t | Type: Buku
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Introduction to NMOS and CMOS VLSI system design/Amar Mukherjee
Author: Mukherjee, Amar; | Call Number: 621.395 Muk i | Type: Buku
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Tutorial VLSI support technology : Computer-aided design, testing and packaging/ Rex Rice
Author: Rice,Rex; | Call Number: 621.395 Ric t | Type: Buku
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