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Intel LANDesk virus protect : test drive kit
Call Number: 004.77 Int | Type: Softcopy Buku
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Efficient construction of large test collections, Hal. 282-289
Author: Gordon V. Cormack; Christopher R. Palmer; Charles L.A. Clarke; | Call Number: SEM-250 | Type: Indeks Artikel prosiding/Sem
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Panel: building and using test collection, Hal. 335-337
Call Number: SEM-248 | Type: Indeks Artikel prosiding/Sem
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High-level test evaluation of asynchronous circuits, Hal. 63-71
Author: Rik Van de Wiel; | Call Number: SEM-234 | Type: Indeks Artikel prosiding/Sem
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Solaris XIL test suite user's guide
Call Number: 005.43 Sol | Type: Buku Manual
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Solaris 2.4 Solaris XGL test user's guide
Call Number: 005.43 Sol | Type: Buku Manual
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Twisted-pair ethernet link test (10base-T)
Call Number: 004 Sun | Type: Buku Manual
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Test disc used in conjuction with CD-ROM diagnosis
Call Number: 005.43 IBM | Type: Softcopy Buku
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Virtual space and place: theory and test, page 1079-1098
Author: Carol Saunders, Anne F. Rutkowski, Michiel van Genuchten, Doug Vogel, and Julio Molina Orrego | Type: Indeks Artikel Jurnal
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Longman preparation course for the TOEFL test IBT LISTENING
Author: Phillips, Deborah; | Call Number: 428.007 6 Phi l | Type: Softcopy Buku
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