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VLSI testing: advanced memory testing algorithms and switch level memory model for srams, HAL. 264-268
Author: Indira Rawat; | Call Number: SEM-290 | Type: Indeks Artikel prosiding/Sem
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Software fault tolerance/edited by Michael R. Lyn
Call Number: 005.1 Sof | Type: Buku
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Foult tolerance principles and practice
Author: Anderson, T.; | Call Number: 004.2 And f | Type: Buku Pusat
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Fault-tolerant computing: Theory and techniques volume I
Call Number: 004.2 Fau | Type: Buku Pusat
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System fault diagnostic, reliability and related knowledge-based approaches vol. 1
Call Number: 620.004 4 Sys | Type: Buku Pusat
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Fault Tolerance Principles and practice/ T. Anderson & P.A. Lee
Author: Anderson T.; | Call Number: 004.2 And f | Type: Buku
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System fault diagnotics reliability and related knowledge-based approaches vol.1/edited by Spyros Tzafestas
Call Number: 620.004 4 Sys | Type: Buku
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Fault analysis for Field Programmable Gate Array (FPGA) using phase path method, HAL. 837-842
Author: B. Kalivaraprasad; T. Madhu; S. Ravi; | Call Number: SEM-289 | Type: Indeks Artikel prosiding/Sem
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Reliable computer systems: design and evaluation/Daniel P. Siewiorek, Robert S. Swartz
Author: Siewiorek, Danil P.; | Call Number: 004 Sie r | Type: Buku
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External memory algorithms
Author: Jeffrey Scott; | Call Number: SEM-243 | Type: Indeks Artikel prosiding/Sem
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