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Technology mapping of timed circuits, Hal. 138-147
Author: Chris J. Myers; Peter A. Beerel; | Call Number: SEM-234 | Type: Indeks Artikel prosiding/Sem
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Testing self-timed circuits using partial scan, Hal. 160-169
Author: Ajay Khoche; Erik Brunvand; | Call Number: SEM-234 | Type: Indeks Artikel prosiding/Sem
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Electronic switching circuits: boolean algebra and mapping/ Matthew Mandl
Author: Mandl, Matthew; | Call Number: 621.381 537 Man e | Type: Buku
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Specifying timed state sequences in powerful decidable logics and timed automata, Hal. 69-80
Author: Thomas Wilke; | Call Number: SEM-253 | Type: Indeks Artikel prosiding/Sem
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Robust timed automata, Hal. 331 - 345
Author: Vineet Gupta; Thomas A. Henzinger; Radha Jagadeesan; | Call Number: 004.33 Mal f | Type: Indeks Artikel prosiding/Sem
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Data-structures for the verfication of timed automata, Hal. 346-360
Author: Eugene Asarin; Marius Bozga; Alain Kerbrat; | Call Number: 004.33 Mal f | Type: Indeks Artikel prosiding/Sem
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Pengendalian Model 3D Melalui Pendeteksian dan Pelacakan TItik Fitur Wajah pada template Matching berdasarkan Gambar Sekuan (138-147)
Author: Fibriani Ike; | Call Number: SEM-315 | Type: Indeks Artikel prosiding/Sem
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Comparing timed C/E systems with timed automata ( abstract ), (LNCS-Lecture Notes in Computer Science 1201) Hal 81-86
Author: R. Huuck; Y. Lakhnech; L. Urbina; S. Engell; S. Kowalewski; J. Preubig; | Call Number: 004.33 Mal h | Type: Indeks Artikel LNCS
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Interactive texture mapping,Hal 27-34
Author: Jerome Maillot; Hussein Yahia; Anne Verroust; | Call Number: SEM-199 | Type: Indeks Artikel prosiding/Sem
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Mapping from aerial photographs
Author: Burnside, C.D.; | Call Number: 526 Bur m | Type: Buku
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