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Your search for 37431 returns 1678 document(s)
Testing self-timed circuits using partial scan, Hal. 160-169
Author: Ajay Khoche; Erik Brunvand; | Call Number: SEM-234 | Type: Indeks Artikel prosiding/Sem
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New CMOS VLSI linear self-timed architectures, Hal. 14-23
Author: A.J. Acosta; M. Bellido; M. Valencia; A. Barriga; R. jimenez and J.L. Huertas; | Call Number: SEM-234 | Type: Indeks Artikel prosiding/Sem
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Logic design projects: using standard intgrated circuits
Author: Walkerly, John F.; | Call Number: 621.391 Wal k | Type: Buku Pusat
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Spice for circuits and electronics using Pspice/Muhammad H. Rashid
Author: Rashid, Muhammad H.; | Call Number: 621.395 Ras s | Type: Buku
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Logic design projects using standard integrated circuits
Author: Wakerly, John F.; | Call Number: 621.391 Wak i | Type: Buku
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Concept based query expansion, Hal. 160-169
Author: Yonggang Qiu; Hp. Frei; | Call Number: SEM-255 | Type: Indeks Artikel prosiding/Sem
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Vehicle's Motion Estimation at the License Plate Using Line Scan Camera (V1-582 -- V1-584)
Author: Zhuxin Zhao Bingwei Hui Xing Zhang Gongjian Wen Deren Li; | Call Number: SEM-334 | Type: Indeks Artikel prosiding/Sem
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Using statistical testing in the evaluation of retrieval experiments, Hal. 329-338
Author: David Hull; | Call Number: SEM-255 | Type: Indeks Artikel prosiding/Sem
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Mutation testing of software using a mind computer, Hal. II.257-II.266
Author: A. Jefferson offutt; | Call Number: SEM-155 | Type: Indeks Artikel prosiding/Sem
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Using design-level scan to improve FPGA design observability and controllability for functional verification, (LNCS-Lecture Notes in Computer Science 2147) Hal 483-492
Author: Timothy Wheeler; Paul Graham; Brent Nelson; Brad Hutchings; | Call Number: 005.115 Fie | Type: Indeks Artikel LNCS
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