Call Number | SEM-290 |
Collection Type | Indeks Artikel prosiding/Sem |
Title | VLSI testing: advanced memory testing algorithms and switch level memory model for srams, HAL. 264-268 |
Author | Indira Rawat; |
Publisher | Proceeding (ICETAETS 2008) of the first International Conf. on Emerging Tenologies and Applications in Engineering, Technology and Scieces, 13-14, January 2008(ICETAETS 2008) |
Subject | Fault signature, fault dictionary march algorithms |
Location |
Nomor Panggil | ID Koleksi | Status |
---|---|---|
SEM-290 | TERSEDIA |